TOP100I09/200G _ Test Probe Tips_Test and Measurement_SMCC_Chip _integrated circuit IC_connector_passive device_semiconductor

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TOP100I09/200G

TOP100I09/200G

Part Number	TOP100I09/200G
Manufacturer	Chip Shine / CSRF
Other Part Numbers	2376-TOP100I09/200G-ND 2376-TOP100I09/200G
Description	ICT SPRING CONTACT TEST PROBE
Detailed Description	3 A Spring Tip - Serrated Head, 0.035" (0.90mm) Dia

Product Attributes

Category		Test and Measurement Test Probe Tips
Manufacturer		Chip Shine / CSRF
Series		TOP100
Packaging		Box
Part Status		Active
Operating Temperature		-55°C ~ 120°C
Material - Body		Phosphor Copper, Gold Plated
Length - Overall		1.310" (33.27mm)
Tip Type		Spring Tip - Serrated Head, 0.035" (0.90mm) Dia
Length - Tip		0.329" (8.35mm)
Material - Tip		Steel, Beryllium Copper, Gold Plated
Current Rating (Amps)		3 A

Documents & Media

RESOURCE TYPE		LINK
Datasheets		TOP100I09/200G

Environmental & Export Classifications

ATTRIBUTE		DESCRIPTION
ECCN		EAR99
HTSUS		8538.90.0000
Moisture Sensitivity Level (MSL)		1 (Unlimited)
REACH Status		Vendor Undefined
RoHS Status		ROHS3 Compliant

Available To Order

Box

QUANTITY	UNIT PRICE	EXT PRICE
1	$1.38	$1.38
10	$1.27	$12.70
25	$1.16	$29.00
50	$1.05	$52.50
100	$0.96	$96.00
200	$0.90	$180.00
500	$0.85	$425.00
1,000	$0.79	$790.00
2,500	$0.73	$1,825.00
5,000	$0.67	$3,350.00